Scanning Electron Microscopy : Physics of Image Formation and Microanalysis / by Ludwig Reimer.
Tipo de material: TextoIdioma: Inglés Series Springer series in optical sciences ; 45Fecha de copyright: Berlin, Heidelberg : Springer, 1998Edición: Second Edition, Completely Revised and Updated EditionDescripción: xiv, 527 pages : illustrations ; 24 cmISBN:- 9783540389675
- 9783642083723
- 23 502.825
Tipo de ítem | Biblioteca actual | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems | |
---|---|---|---|---|---|---|---|---|
Colección general | Biblioteca Yachay Tech | 502.825 R363s 1998 (Navegar estantería(Abre debajo)) | Ej. 1 | Disponible | 005706 |
1. Introduction -- 2. Electron Optics of a Scanning Electron Microscope -- 3. Electron Scattering and Diffusion -- 4. Emission of Backscattered and Secondary Electrons -- 5. Electron Detectors and Spectrometers -- 6. Image Contrast and Signal Processing -- 7. Electron-Beam-Induced Current and Cathodoluminescence -- 8. Special Techniques in SEM -- 9. Crystal Structure Analysis by Diffraction -- 10. Elemental Analysis and Imaging with X-Rays.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information
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