Scanning Electron Microscopy : Physics of Image Formation and Microanalysis /
Reimer, Ludwig
Scanning Electron Microscopy : Physics of Image Formation and Microanalysis / by Ludwig Reimer. - Second Edition, Completely Revised and Updated Edition. - xiv, 527 pages : illustrations ; 24 cm. - Springer series in optical sciences 45 .
1. Introduction -- 2. Electron Optics of a Scanning Electron Microscope -- 3. Electron Scattering and Diffusion -- 4. Emission of Backscattered and Secondary Electrons -- 5. Electron Detectors and Spectrometers -- 6. Image Contrast and Signal Processing -- 7. Electron-Beam-Induced Current and Cathodoluminescence -- 8. Special Techniques in SEM -- 9. Crystal Structure Analysis by Diffraction -- 10. Elemental Analysis and Imaging with X-Rays.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information
9783540389675 9783642083723
Scanning electron microscopy
Physics
Spectroscopy
Microscopy
Microscopía electrónica de barrido
Física
Espectroscopía
Microscopía
502.825
Scanning Electron Microscopy : Physics of Image Formation and Microanalysis / by Ludwig Reimer. - Second Edition, Completely Revised and Updated Edition. - xiv, 527 pages : illustrations ; 24 cm. - Springer series in optical sciences 45 .
1. Introduction -- 2. Electron Optics of a Scanning Electron Microscope -- 3. Electron Scattering and Diffusion -- 4. Emission of Backscattered and Secondary Electrons -- 5. Electron Detectors and Spectrometers -- 6. Image Contrast and Signal Processing -- 7. Electron-Beam-Induced Current and Cathodoluminescence -- 8. Special Techniques in SEM -- 9. Crystal Structure Analysis by Diffraction -- 10. Elemental Analysis and Imaging with X-Rays.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information
9783540389675 9783642083723
Scanning electron microscopy
Physics
Spectroscopy
Microscopy
Microscopía electrónica de barrido
Física
Espectroscopía
Microscopía
502.825