Transmission electron microscopy : physics of image formation and microanalysis / Ludwig Reimer y Helmut Kohl.
Tipo de material: TextoIdioma: Inglés Series Springer series in optical sciences ; V. 36Fecha de copyright: New York : Springer , 2010Edición: First EditionDescripción: 587 pages : illustrations ; 24 cmISBN:- 9780387347585
- 23 530.41
Tipo de ítem | Biblioteca actual | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems | |
---|---|---|---|---|---|---|---|---|
Colección general | Biblioteca Yachay Tech | 530.41 R363t 2010 (Navegar estantería(Abre debajo)) | Ej. 1 | Disponible | 005680 |
Particle optics of electrons -- Wave optics of electrons -- Elements of a transmission electron microscope -- Electron-specimen interactions -- Scattering and phase contrast for amorphous specimens -- Theory of electron diffraction -- Electron-diffraction modes and applications -- Imaging of crystalline specimens and their defects -- Elemental analysis by X-ray and election energy-loss spectroscopy -- Specimen damage by electron irradiation.
This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.
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