Modern RF and microwave measurement techniques / edited by Valeria Teppati, ETH Zurich, Andrea Ferrero, Politecnico di Torino, Mohamed Sayed, Microwave and Millimeter Wave Solutions.
Tipo de material: TextoIdioma: Inglés Series The cambridge RF and microwave engineering seriesDetalles de publicación: New York : Cambridge University Press, c2013.Descripción: xxv, 447 pages : illustrations ; 26 cmISBN:- 9781107036413 (hardback)
- 621.382 23
Tipo de ítem | Biblioteca actual | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems | |
---|---|---|---|---|---|---|---|---|
Colección general | Biblioteca Yachay Tech | 621.3820287 T3148m 2013 (Navegar estantería(Abre debajo)) | Ej. 1 | Disponible | 002601 | |||
Colección general | Biblioteca Yachay Tech | 621.3820287 T3148m 2013 (Navegar estantería(Abre debajo)) | Ej. 2 | Disponible | 002602 | |||
Colección general | Biblioteca Yachay Tech | 621.3820287 T3148m 2013 (Navegar estantería(Abre debajo)) | Ej. 3 | Disponible | 002603 |
Includes bibliographical references and index.
"This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analysers, real-time spectrum analysis, sampling oscilloscopes and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and dielectric measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail, and accompanied by state-of-the-art solutions to the unique technical challenges associated with its deployment. With each chapter delivered by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements"--
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