Noncontact atomic force microscopy / Seizo Morita, Franz J. Giessibl and Roland Wiesendanger, editors.

Contributor(s): Morita, S. (Seizo), 1948- [editor] | Giessibl, Franz J [editor] | Wiesendanger, R. (Roland), 1961- [editor]Material type: TextTextLanguage: English Series: Nanoscience and TechnologyCopyright date: Berlin ; Springer, 2009Edition: First EditionDescription: xviii, 401 pages : illustrations ; 24 cmISBN: 9783642014949; 9783642014956Subject(s): Atomic force microscopy | Nanotechnology | Surfaces (Physics) | Fuerza atómica microscópica | Nanotecnología | Superficies (Física)DDC classification: 620.115
Partial contents:
Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
Abstract: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
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Item type Current library Call number Copy number Status Date due Barcode Item holds
Libro académico Libro académico Biblioteca del Campus
620.115 N8127 2009 (Browse shelf (Opens below)) Ej. 1, Vol. 2 Available 001247
Libro académico Libro académico Biblioteca del Campus
620.115 N8127 2009 (Browse shelf (Opens below)) Ej. 2, Vol. 2 Available 000906
Libro académico Libro académico Biblioteca del Campus
620.115 N8127 2009 (Browse shelf (Opens below)) Ej. 3, Vol. 2 Available 001252
Total holds: 0

Includes index.

With 196 figures

Includes bibliographical references.

Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

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