Applied scanning probe methods /
Applied scanning probe methods /
Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].
- Berlin ; New York : Springer, c2004
- xx, 476 p. : ill. ; 24 cm.
Includes bibliographical references and index.
3540005277 (alk. paper) 9783540005278
2003059049
Materials--Microscopy.
Scanning probe microscopy.
TA417.23 / .A655 2004
620.112
Includes bibliographical references and index.
3540005277 (alk. paper) 9783540005278
2003059049
Materials--Microscopy.
Scanning probe microscopy.
TA417.23 / .A655 2004
620.112