000			04156cam a22004577i 4500
001			17387332
005			20150416173154.0
008			120716s2012 gw a b 001 0 eng d
010			_a 2012944383
016	7		_a016050242 _2Uk
020			_a9783642274930 (alk. paper)
020			_a3642274935 (alk. paper)
020			_a9783642274947 (ebk.)
035			_a(OCoLC)ocn767567996
040			_aBTCTA _beng _cBTCTA _dUKMGB _dYDXCP _dBWX _dPAU _dOCLCO _dSHH _dOCLCO _dUND _dOHX _dHEBIS _dOCLCF _dOCLCQ _dDLC
042			_alccopycat
050	0	0	_aQH212.S33 _bA26 2013
072		7	_aTK _2lcco
072		7	_aQ _2lcco
082	0	0	_a502.8/2 _223
245	0	0	_aAcoustic scanning probe microscopy / _cFrancesco Marinello, Daniele Passeri, Enrico Savio, editors.
300			_axxv, 494 pages : _billustrations ; _c24 cm.
490	1		_aNanoScience and technology, _x1434-4904
504			_aIncludes bibliographical references and index.
505	0	0	_tAcoustic Scanning Probe Microscopy: An Overview / _rD. Passeri and F. Marinello -- _tContact, Interactions, and Dynamics / _rE. Barthel -- _tCantilever Dynamics: Theoretical Modeling / _rJohn H. Cantrell and Sean A. Cantrell -- _tOne-Dimensional Finite Element Modeling of AFM Cantilevers / _rRichard Arinero and Gérard Lévêque -- _tAtomic Force Acoustic Microscopy / _rU. Rabe, M. Kopycinska-Müller and S. Hirsekorn -- _tUltrasonic Atomic Force Microscopy UAFM / _rKazushi Yamanaka and Toshihiro Tsuji -- _tEnhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers / _rMikio Muraoka -- _tScanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology / _rP. Vairac, J. Le Rouzic, P. Delobelle and B. Cretin -- _tUltrasonic Force Microscopies / _rOleg Kolosov and Andrew Briggs -- _tScanning Near-Field Ultrasound Holography / _rShraddha Avasthy, Gajendra S. Shekhawat and Vinayak P. Dravid -- _tMapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy / _rAndrzej Sikora and Łukasz Bednarz -- _tQuantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques / _rD.C. Hurley -- _tData Processing for Acoustic Probe Microscopy Techniques / _rF. Marinello, D. Passeri, P. Schiavuta and E. Savio -- _tFriction and Internal Friction Measurements by Atomic Force Acoustic Microscopy / _rA. Caron and W. Arnold -- _tQuantitative Subsurface Imaging by Acoustic AFM Techniques / _rZehra Parlak and Levent F. Degertekin -- _tPolymer Material Characterization by Acoustic Force Microscopy / _rChad S. Korach -- _tApplication of Acoustic Techniques for Characterization of Biological Samples / _rBernhard R. Tittmann and Anne Ebert.
520			_aThe combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.--
650		0	_aScanning probe microscopy.
650		0	_aAcoustic microscopy.
650		7	_aAcoustic microscopy. _2fast
650		7	_aScanning probe microscopy. _2fast
650		7	_aRasterkraftmikroskopie _2gnd
650		7	_aAkustische Mikroskopie _2gnd
700	1		_aMarinello, Francesco.
700	1		_aPasseri, Daniele.
700	1		_aSavio, Enrico.
830		0	_aNanoscience and technology.
906			_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg
942			_2ddc _cLIBRO
955			_brl09 2014-10-10 z-processor _irl09 2014-10-15 ; to Dewey
955			_apc17 2012-07-16 _axh00 2012-12-12 to STM
999			_c391