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020 _a9780387347585
040 _aEC-UrYT
_cEC-UrYT
041 _aeng
082 0 4 _223
_a530.41
100 1 _97362
_aReimer, Ludwing
245 1 0 _aTransmission electron microscopy :
_bphysics of image formation and microanalysis /
_cLudwig Reimer y Helmut Kohl.
250 _aFirst Edition
264 3 4 _aNew York :
_bSpringer ,
_c2010.
300 _a587 pages :
_billustrations ;
_c24 cm.
490 _aSpringer series in optical sciences
_vV. 36
505 2 _aParticle optics of electrons -- Wave optics of electrons -- Elements of a transmission electron microscope -- Electron-specimen interactions -- Scattering and phase contrast for amorphous specimens -- Theory of electron diffraction -- Electron-diffraction modes and applications -- Imaging of crystalline specimens and their defects -- Elemental analysis by X-ray and election energy-loss spectroscopy -- Specimen damage by electron irradiation.
520 3 _aThis text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.
650 2 4 _97365
_aTransmission electron microscopy
650 2 4 _97366
_aMicroscopio de transmisión por electrones
650 2 4 _9432
_aPhysics
650 2 4 _9102
_aFísica
650 2 4 _95708
_aCondensed matter
650 2 4 _95709
_aMateria Condensada
942 _2ddc
_cLIBRO
999 _c3110