000 01047cam a2200325Ia 4500
003 OSt
005 20150608163230.0
008 090322s2009 gw a sb 001 0 eng d
020 _z9783642014949
020 _a9783642014956
040 _aCaPaEBR
_cCaPaEBR
041 _aeng
082 _a620.5
210 1 0 _aNoncontact atomic force microscopy.
245 0 0 _aNoncontact atomic force microscopy.
_nVolume 2 /
_cSeizo Morita, Franz J. Giessibl, Roland Wiesendanger, editor.
260 _aBerlin ;
_bSpringer,
_cc2009.
300 _axviii, 401 p.
_bill.
_c24 cm.
490 1 _aNanoscience and technology,
_x1434-4904
504 _aIncludes bibliographical references and index.
650 0 _aAtomic force microscopy.
650 0 _aScanning probe microscopy.
655 7 _aElectronic books.
_2local
700 1 _aMorita, S.
_q(Seizo),
_d1948-
700 1 _aWiesendanger, R.
_q(Roland),
_d1961-
700 1 _aGiessibl, Franz J.
710 2 _aebrary, Inc.
830 0 _aNanoscience and technology.
942 _2ddc
_cLIBRO
999 _c1160