01047cam a2200325Ia 4500
OSt
20150608163230.0
090322s2009 gw a sb 001 0 eng d
9783642014949
9783642014956
CaPaEBR
CaPaEBR
eng
620.5
Noncontact atomic force microscopy.
Noncontact atomic force microscopy.
Volume 2 /
Seizo Morita, Franz J. Giessibl, Roland Wiesendanger, editor.
Berlin ;
Springer,
c2009.
xviii, 401 p.
ill.
24 cm.
Nanoscience and technology,
1434-4904
Includes bibliographical references and index.
Atomic force microscopy.
Scanning probe microscopy.
Electronic books.
local
Morita, S.
(Seizo),
1948-
Wiesendanger, R.
(Roland),
1961-
Giessibl, Franz J.
ebrary, Inc.
Nanoscience and technology.
ddc
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Campus
2014-09-04
Compra Yachay EP
015741
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620.115 N8127 2009
001247
2021-01-18
Ej. 1, Vol. 2
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Campus
2014-09-04
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015740
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000906
2021-01-18
Ej. 2, Vol. 2
2015-06-08
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0
0
Campus
Campus
2014-09-04
Compra Yachay EP
015742
312.08
001252
0
620.115 N8127 2009
001252
2021-01-18
Ej. 3, Vol. 2
2015-06-08
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