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Roadmap of scanning probe microscopy / S. Morita, editors.

Contributor(s): Morita, S. (Seizo), 1948- [editor].
Material type: materialTypeLabelBookSeries: Nanoscience and Technology.Copyright date: Berlin : New York ; Springer, c2007Edition: First Edition.Description: xvii, 201 pages : illustrations ; 25 cm.ISBN: 9783540343141 (hd.bd.); 3540343148 (hd.bd.).Subject(s): Scanning tunneling microscopy | Escaneo de microscopía de efecto túnel | Scanning probe microscopy | Microscopio de sonda de barridoDDC classification: 502.825 Online resources: Publisher description | Table of contents only
Partial contents:
1 Science and technology in the twenty-first century / Seizo Morita -- 2 Scanning tunneling microscopy / Masahiko Tomitori -- 3 Atomic force microscopy / Yasuhiro Sugawara -- 4 Near-field scanning optical microscope / Toshiharu Saiki -- 5 Scanning capacitance micrscopy / Yoshitsugu Nakagawa -- 6 Electrostatic force microscopy / Masakazu Nakamura and Hirofumi Yamada -- 7 Magnetic force microscope / Sumio Hosaka -- 8 STM-induced photon emission spectroscopy / Tooru Murashita -- 9 Scanning atom probe / Osamu Nishikawa -- 10 Chemical discrimination of atoms and molecules / Komeda Tadahiro, Seizo Morita, Yauhiro Sugawara -- 11 Manipulation of atoms and molecules / Tadahiro komeda et al. -- 12 Multiprobe SPM / Shuji Hasegawa -- 13 AFM measurement in liquid / Hirofumi Yamada -- 14 High speed SPM / Toshio Ando -- 15 Scanning nonlinear diselectric microscope / Yasuo CHo -- 16 SPM coupled with external fields / Ken Nakajima, Tadahiro Komeda -- 17 Probe technology / Masamichi Yoshimura -- 18 Characterization of semiconducting materials / Shuji Hasegawa, Masahiko Tomitori -- 19 Evaluation of SPM for LSI devices / Koji Usuda, Takashi Furukawa, Yasushi Kadota -- 20 SPM characterization of catalysts / Hiroshi Onishi -- 21 SPM characterizaion of biomaterials / Atsushi Ikai, Rehana Afrin -- 22 SPM characterization of organic and polymeric materials / Shukichi Tanaka, Ken Nakajima -- 23 Theories of SPM / Masaru Tsukada, Shin-ya Hasegawa -- 24 When will SPM realize our dreams? / Osamu Kubo.
Abstract: Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.
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Item type Current location Call number Copy number Status Date due Item holds
Libro académico Libro académico Biblioteca del Campus
502.825 R6286 2007 (Browse shelf) Ej. 1 Available
Libro académico Libro académico Biblioteca del Campus
502.825 R6286 2007 (Browse shelf) Ej. 2 Available
Libro académico Libro académico Biblioteca del Campus
502.825 R6286 2007 (Browse shelf) Ej. 3 Available
Total holds: 0

Includes index.

Includes bibliographical references.

1 Science and technology in the twenty-first century / Seizo Morita -- 2 Scanning tunneling microscopy / Masahiko Tomitori -- 3 Atomic force microscopy / Yasuhiro Sugawara -- 4 Near-field scanning optical microscope / Toshiharu Saiki -- 5 Scanning capacitance micrscopy / Yoshitsugu Nakagawa -- 6 Electrostatic force microscopy / Masakazu Nakamura and Hirofumi Yamada -- 7 Magnetic force microscope / Sumio Hosaka -- 8 STM-induced photon emission spectroscopy / Tooru Murashita -- 9 Scanning atom probe / Osamu Nishikawa -- 10 Chemical discrimination of atoms and molecules / Komeda Tadahiro, Seizo Morita, Yauhiro Sugawara -- 11 Manipulation of atoms and molecules / Tadahiro komeda et al. -- 12 Multiprobe SPM / Shuji Hasegawa -- 13 AFM measurement in liquid / Hirofumi Yamada -- 14 High speed SPM / Toshio Ando -- 15 Scanning nonlinear diselectric microscope / Yasuo CHo -- 16 SPM coupled with external fields / Ken Nakajima, Tadahiro Komeda -- 17 Probe technology / Masamichi Yoshimura -- 18 Characterization of semiconducting materials / Shuji Hasegawa, Masahiko Tomitori -- 19 Evaluation of SPM for LSI devices / Koji Usuda, Takashi Furukawa, Yasushi Kadota -- 20 SPM characterization of catalysts / Hiroshi Onishi -- 21 SPM characterizaion of biomaterials / Atsushi Ikai, Rehana Afrin -- 22 SPM characterization of organic and polymeric materials / Shukichi Tanaka, Ken Nakajima -- 23 Theories of SPM / Masaru Tsukada, Shin-ya Hasegawa -- 24 When will SPM realize our dreams? / Osamu Kubo.

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

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