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Acoustic scanning probe microscopy / Francesco Marinello, Daniele Passeri, Enrico Savio, editors.

Contributor(s): Marinello, Francesco [editor] | Passeri, Daniele [editor] | Savio, Enrico [editor].
Material type: materialTypeLabelBookSeries: Nanoscience and Technology.Copyright date: Berlin : Springer-Verlag, c2013Edition: First Edition.Description: xxv, 494 pages : illustrations ; 24 cm.ISBN: 9783642274930 (alk. paper); 3642274935 (alk. paper); 9783642274947 (ebk.).Subject(s): Scanning probe microscopy | Microscopio de sonda de barrido | Acoustic microscopy | Microscopía acústica | Scanning probe microscopy | Microscopio de sonda de barridoDDC classification: 502.82
Partial contents:
Acoustic Scanning Probe Microscopy: An Overview -- Contact, Interactions, and Dynamics -- Cantilever Dynamics: Theoretical Modeling -- One-Dimensional Finite Element Modeling of AFM Cantilevers -- Atomic Force Acoustic Microscopy -- Ultrasonic Atomic Force Microscopy UAFM -- Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers -- Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology -- Ultrasonic Force Microscopies -- Scanning Near-Field Ultrasound Holography -- Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy -- Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques -- Data Processing for Acoustic Probe Microscopy Techniques -- Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy -- Quantitative Subsurface Imaging by Acoustic AFM Techniques -- Polymer Material Characterization by Acoustic Force Microscopy -- Application of Acoustic Techniques for Characterization of Biological Samples
Abstract: The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.--
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Item type Current location Call number Copy number Status Date due Item holds
Libro académico Libro académico Biblioteca del Campus
502.82 A185 2013 (Browse shelf) Ej. 1 Available
Libro académico Libro académico Biblioteca del Campus
502.82 A185 2013 (Browse shelf) Ej. 2 Available
Libro académico Libro académico Biblioteca del Campus
502.82 A185 2013 (Browse shelf) Ej. 3 Available
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Includes index.

Includes bibliographical references.

Acoustic Scanning Probe Microscopy: An Overview -- Contact, Interactions, and Dynamics -- Cantilever Dynamics: Theoretical Modeling -- One-Dimensional Finite Element Modeling of AFM Cantilevers -- Atomic Force Acoustic Microscopy -- Ultrasonic Atomic Force Microscopy UAFM -- Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers -- Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology -- Ultrasonic Force Microscopies -- Scanning Near-Field Ultrasound Holography -- Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy -- Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques -- Data Processing for Acoustic Probe Microscopy Techniques -- Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy -- Quantitative Subsurface Imaging by Acoustic AFM Techniques -- Polymer Material Characterization by Acoustic Force Microscopy -- Application of Acoustic Techniques for Characterization of Biological Samples

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.--

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