Noncontact atomic force microscopy / Seizo Morita, Franz J. Giessibl and Roland Wiesendanger, editors.
Contributor(s): Morita, S. (Seizo) [editor] | Giessibl, Franz J [editor] | Wiesendanger, R. (Roland) [editor].Material type: BookSeries: Nanoscience and Technology.Copyright date: Berlin ; Springer , 2009Edition: First Edition.Description: xviii, 401 pages : illustrations ; 24 cm.ISBN: 9783642014949; 9783642014956.Subject(s): Atomic force microscopy | Nanotechnology | Surfaces (Physics) | Fuerza atómica microscópica | Nanotecnología | Superficies (Física)DDC classification: 620.115
|Item type||Current location||Call number||Copy number||Status||Date due||Item holds|
|Libro académico||Biblioteca del Campus||620.115 N8127 2009 (Browse shelf)||Ej. 1, Vol. 2||Available|
|Libro académico||Biblioteca del Campus||620.115 N8127 2009 (Browse shelf)||Ej. 2, Vol. 2||Available|
|Libro académico||Biblioteca del Campus||620.115 N8127 2009 (Browse shelf)||Ej. 3, Vol. 2||Available|
With 196 figures
Includes bibliographical references.
Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.