Normal view MARC view ISBD view

Noncontact atomic force microscopy / Seizo Morita, Franz J. Giessibl and Roland Wiesendanger, editors.

Contributor(s): Morita, S. (Seizo), 1948- [editor] | Giessibl, Franz J [editor] | Wiesendanger, R. (Roland), 1961- [editor].
Material type: materialTypeLabelBookSeries: Nanoscience and Technology.Copyright date: Berlin ; Springer , 2009Edition: First Edition.Description: xviii, 401 pages : illustrations ; 24 cm.ISBN: 9783642014949; 9783642014956.Subject(s): Atomic force microscopy | Nanotechnology | Surfaces (Physics) | Fuerza atómica microscópica | Nanotecnología | Superficies (Física)DDC classification: 620.115
Partial contents:
Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
Abstract: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Tags from this library: No tags from this library for this title. Log in to add tags.
    average rating: 0.0 (0 votes)
Item type Current location Call number Copy number Status Date due Item holds
Libro académico Libro académico Biblioteca del Campus
620.115 N8127 2009 (Browse shelf) Ej. 1, Vol. 2 Available
Libro académico Libro académico Biblioteca del Campus
620.115 N8127 2009 (Browse shelf) Ej. 2, Vol. 2 Available
Libro académico Libro académico Biblioteca del Campus
620.115 N8127 2009 (Browse shelf) Ej. 3, Vol. 2 Available
Total holds: 0

Includes index.

With 196 figures

Includes bibliographical references.

Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

There are no comments for this item.

Log in to your account to post a comment.