Acoustic scanning probe microscopy /
Acoustic scanning probe microscopy /
Francesco Marinello, Daniele Passeri, Enrico Savio, editors.
- xxv, 494 pages : illustrations ; 24 cm.
- NanoScience and technology, 1434-4904 .
- Nanoscience and technology. .
Includes bibliographical references and index.
Acoustic Scanning Probe Microscopy: An Overview / Contact, Interactions, and Dynamics / Cantilever Dynamics: Theoretical Modeling / One-Dimensional Finite Element Modeling of AFM Cantilevers / Atomic Force Acoustic Microscopy / Ultrasonic Atomic Force Microscopy UAFM / Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers / Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology / Ultrasonic Force Microscopies / Scanning Near-Field Ultrasound Holography / Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy / Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques / Data Processing for Acoustic Probe Microscopy Techniques / Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy / Quantitative Subsurface Imaging by Acoustic AFM Techniques / Polymer Material Characterization by Acoustic Force Microscopy / Application of Acoustic Techniques for Characterization of Biological Samples / D. Passeri and F. Marinello -- E. Barthel -- John H. Cantrell and Sean A. Cantrell -- Richard Arinero and Gérard Lévêque -- U. Rabe, M. Kopycinska-Müller and S. Hirsekorn -- Kazushi Yamanaka and Toshihiro Tsuji -- Mikio Muraoka -- P. Vairac, J. Le Rouzic, P. Delobelle and B. Cretin -- Oleg Kolosov and Andrew Briggs -- Shraddha Avasthy, Gajendra S. Shekhawat and Vinayak P. Dravid -- Andrzej Sikora and Łukasz Bednarz -- D.C. Hurley -- F. Marinello, D. Passeri, P. Schiavuta and E. Savio -- A. Caron and W. Arnold -- Zehra Parlak and Levent F. Degertekin -- Chad S. Korach -- Bernhard R. Tittmann and Anne Ebert.
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.--
9783642274930 (alk. paper) 3642274935 (alk. paper) 9783642274947 (ebk.)
2012944383
016050242 Uk
Scanning probe microscopy.
Acoustic microscopy.
Acoustic microscopy.
Scanning probe microscopy.
Rasterkraftmikroskopie
Akustische Mikroskopie
QH212.S33 / A26 2013
502.8/2
Includes bibliographical references and index.
Acoustic Scanning Probe Microscopy: An Overview / Contact, Interactions, and Dynamics / Cantilever Dynamics: Theoretical Modeling / One-Dimensional Finite Element Modeling of AFM Cantilevers / Atomic Force Acoustic Microscopy / Ultrasonic Atomic Force Microscopy UAFM / Enhanced Sensitivity of AFAM and UAFM by Concentrated-Mass Cantilevers / Scanning Microdeformation Microscopy: Advances in Quantitative Micro- and Nanometrology / Ultrasonic Force Microscopies / Scanning Near-Field Ultrasound Holography / Mapping of the Surface's Mechanical Properties Through Analysis of Torsional Cantilever Bending in Dynamic Force Microscopy / Quantitative Measurements of Elastic Properties with Ultrasonic-Based AFM and Conventional Techniques / Data Processing for Acoustic Probe Microscopy Techniques / Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy / Quantitative Subsurface Imaging by Acoustic AFM Techniques / Polymer Material Characterization by Acoustic Force Microscopy / Application of Acoustic Techniques for Characterization of Biological Samples / D. Passeri and F. Marinello -- E. Barthel -- John H. Cantrell and Sean A. Cantrell -- Richard Arinero and Gérard Lévêque -- U. Rabe, M. Kopycinska-Müller and S. Hirsekorn -- Kazushi Yamanaka and Toshihiro Tsuji -- Mikio Muraoka -- P. Vairac, J. Le Rouzic, P. Delobelle and B. Cretin -- Oleg Kolosov and Andrew Briggs -- Shraddha Avasthy, Gajendra S. Shekhawat and Vinayak P. Dravid -- Andrzej Sikora and Łukasz Bednarz -- D.C. Hurley -- F. Marinello, D. Passeri, P. Schiavuta and E. Savio -- A. Caron and W. Arnold -- Zehra Parlak and Levent F. Degertekin -- Chad S. Korach -- Bernhard R. Tittmann and Anne Ebert.
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.--
9783642274930 (alk. paper) 3642274935 (alk. paper) 9783642274947 (ebk.)
2012944383
016050242 Uk
Scanning probe microscopy.
Acoustic microscopy.
Acoustic microscopy.
Scanning probe microscopy.
Rasterkraftmikroskopie
Akustische Mikroskopie
QH212.S33 / A26 2013
502.8/2